Integrated circuit having a clock deskew circuit that includes an injection-locked oscillator

ABSTRACT

Methods and apparatuses featuring an injection-locked oscillator (ILO) are described. In some embodiments, an ILO can have multiple injection points and a free-running frequency that is capable of being adjusted based on a control signal. In some embodiments, each injection point of an ILO can correspond to a phase tuning range. In some embodiments, a circuit can include circuitry to detect a phase boundary between two adjacent phase tuning ranges. In some embodiments, a circuit can use the detected phase boundary to switch between the two adjacent phase tuning ranges.

RELATED APPLICATION

This application is a continuation of, and claims priority to U.S.application Ser. No. 13/353,851, Attorney Docket No. R-RA0938.P.US,having the same title and inventors, filed 19 Jan. 2012, the contents ofwhich are herein incorporated by reference in their entirety for allpurposes. U.S. application Ser. No. 13/353,851 is a non-provisional of,and claims priority to, U.S. Provisional Application No. 61/448,885,Attorney Docket Number R-RA0938.Prov1.US, having the same title andinventors, filed 3 Mar. 2011, the contents of which are incorporatedherein by reference in their entirety for all purposes.

FIELD

This disclosure generally relates to electronic circuits. Thisdisclosure generally relates to integrated circuit devices that includean injection-locked oscillator (ILO) circuit.

BACKGROUND

Some applications (e.g., high-performance memory systems) use circuitsfor adjusting the phase of a clock signal. An injection-lockedoscillator (ILO) can be used in a phase adjustment circuit that adjuststhe phase of a clock signal with respect to a reference phase. SomeILO-based phase adjustment circuits add a significant amount of complexcircuitry to adjust the phase of the output clock signal.

BRIEF DESCRIPTION OF THE FIGURES

FIG. 1 illustrates an ILO-based clock deskew circuit in accordance withsome embodiments described in this disclosure.

FIG. 2 illustrates signal waveforms associated with an ILO-based clockdeskew circuit in accordance with some embodiments described in thisdisclosure.

FIG. 3A illustrates an ILO-based clock deskew circuit in accordance withsome embodiments described in this disclosure.

FIG. 3B presents a flowchart that illustrates a process for modifyingthe phase of a clock signal using an ILO-based clock deskew circuit inaccordance with some embodiments described in this disclosure.

FIG. 3C illustrates phase curves for an ILO-based clock deskew circuitin accordance with some embodiments described in this disclosure.

FIG. 4A illustrates how an ILO-based clock deskew circuit can becalibrated in accordance with some embodiments described in thisdisclosure.

FIG. 4B illustrates an embodiment of a ±45° phase shift and ILO delaycircuit in accordance with some embodiments described in thisdisclosure.

FIG. 4C presents a flowchart that illustrates a process for calibratingan ILO-based clock deskew circuit in accordance with some embodimentsdescribed in this disclosure.

FIG. 5A illustrates an ILO-based clock deskew circuit in accordance withsome embodiments described in this disclosure.

FIG. 5B presents a flowchart that illustrates a process for modifyingthe phase of a clock signal using an ILO-based clock deskew circuit inaccordance with some embodiments described in this disclosure.

FIG. 6A illustrates how an ILO-based clock deskew circuit can becalibrated in accordance with some embodiments described in thisdisclosure.

FIG. 6B presents a flowchart that illustrates a process for calibratingan ILO-based clock deskew circuit in accordance with some embodimentsdescribed in this disclosure.

FIG. 7A illustrates an ILO-based clock deskew circuit in accordance withsome embodiments described in this disclosure.

FIG. 7B illustrates phase tuning curves for three successive injectionpoints in accordance with some embodiments described in this disclosure.

FIG. 8 illustrates a memory controller that includes an ILO-based clockdeskew circuit in accordance with some embodiments described in thisdisclosure.

DETAILED DESCRIPTION

Embodiments presented in this disclosure are directed to methods andapparatuses featuring a circuit that uses an ILO to adjust the phase ofa clock signal. In some embodiments, the ILO locks onto an input clocksignal if the frequency of the input clock signal is relatively close tothe free-running frequency of the ILO, or relatively close to asub-harmonic or a super-harmonic of the free-running frequency of theILO. In some embodiments, the phase of an output clock signal can beadjusted by varying the difference between an injection clock signalfrequency (which can be the same as the input clock signal frequency)and the free-running frequency of the ILO. Specifically, in someembodiments, the ILO-based clock deskew circuit can be calibrated sothat a free-running frequency of the ILO can be established for a targetphase value, thereby enabling the ILO-based clock deskew circuit tooutput the clock signal with the target phase by tuning the ILO to thedetermined free-running frequency. In some embodiments, the ILO-basedclock deskew circuit can include detection circuitry that is capable ofdetecting a phase boundary between adjacent phase tuning ranges. In thisdisclosure, unless otherwise stated, the phrase “based on” means “basedsolely or partly on.”

Embodiments described herein include, but are not limited to, ILOs thatare based on a tank circuit (i.e., an inductor/capacitor oscillator) ora ring oscillator, with one or more nodes for receiving an input clocksignal, and one or more nodes for outputting an output clock signal.

FIG. 1 illustrates an ILO-based clock deskew circuit in accordance withsome embodiments described in this disclosure.

In some embodiments, ILO-based clock deskew circuit 102 outputs outputclock signal 104 based on input clock signal 106 and phase information108. Specifically, in some embodiments, the frequency of output clocksignal 104 can be based on the frequency of input clock signal 106(e.g., they can be substantially equal), and ILO-based clock deskewcircuit 102 can be calibrated so that the phase of output clock signal104 can be set to a desired value by providing appropriate phaseinformation 108 to ILO-based clock deskew circuit 102. The methods andapparatuses described in this disclosure are generally applicable to anyintegrated circuit device (or system) that includes one or moreILO-based clock deskew circuits.

FIG. 2 illustrates signal waveforms associated with an ILO-based clockdeskew circuit in accordance with some embodiments described in thisdisclosure.

In some embodiments, nominal clock waveform 200 can correspond to anominal clock signal, which may or may not be the input clock signal ofthe ILO-based clock deskew circuit. Time instances T0-T10 correspond toedge transitions of nominal clock waveform 200. Output clock waveforms204-1, 204-2, and 204-3 may correspond to the output clock signal (e.g.,output clock signal 104) of the ILO-based clock deskew circuit (e.g.,ILO-based clock deskew circuit 102) for different phase informationvalues. The frequency of output clock waveform 204 can be substantiallyequal to the frequency of nominal clock waveform 200. In someembodiments, the ILO-based clock deskew circuit can be used to adjustthe phase of the output clock signal with respect to the nominal clocksignal based on the phase information that is provided to the ILO-basedclock deskew circuit.

For example, as shown in FIG. 2, if the phase information value is V1,the ILO-based clock deskew circuit may produce output clock waveform204-1, which has a zero phase difference with respect to nominal clockwaveform 200. Similarly, if the phase information value is V2 or V3, theILO-based clock deskew circuit may produce output clock waveforms 204-2or 204-3, respectively, having phase differences θ₂ or θ₃, respectively,with respect to nominal clock waveform 200.

FIG. 3A illustrates an ILO-based clock deskew circuit in accordance withsome embodiments described in this disclosure.

In some embodiments, ILO-based clock deskew circuit 302 can includephase controller 314, demultiplexer 312, and ILO 310. Demultiplexer 312can receive input clock signal 306 and inject an injection clock signalinto one of multiple injection points of ILO 310 based on injectionpoint select signal 318. For example, demultiplexer 312 can inject,based on injection point select signal 318, the injection clock signalinto an in-phase injection point (denoted by “I”) or a quadrature-phaseinjection point (denoted by “Q”). Demultiplexer 312 can also adjust theamplitude of the injection clock signal (shown in FIG. 3A as gain “K”).ILO 310 can receive free-running frequency control signal 316 which canbe used to vary the free-running frequency of ILO 310. In someembodiments, phase controller 314 can receive phase information 308 andgenerate injection point select signal 318 and free-running frequencycontrol signal 316.

FIG. 3B presents a flowchart that illustrates a process for modifyingthe phase of a clock signal using an ILO-based clock deskew circuit,e.g., ILO-based clock deskew circuit 302, in accordance with someembodiments described in this disclosure.

In some embodiments, an ILO-based clock deskew circuit can receive phaseinformation (operation 352). The phase information can indicate a targetphase setting for the output clock signal of ILO. Next, the ILO-basedclock deskew circuit can select an injection point and determine afree-running frequency value based on the received phase information(operation 354). The ILO-based clock deskew circuit can then inject theinjection clock signal at the selected injection point in the ILO andtune the free-running frequency of the ILO to the determinedfree-running frequency value (operation 356), thereby causing the outputclock signal of the ILO to have the target phase.

Specifically, in some embodiments, phase controller 314 can generateinjection point select signal 318 and free-running frequency controlsignal 316 based on phase information 308. Injection point select signal318 can be provided as a control signal to demultiplexer 312 in order toinject the injection clock signal at a particular injection point in ILO310, and the free-running frequency control signal 316 can be providedto ILO 310 to tune the free-running frequency of ILO 310 to a desiredvalue. In this manner, ILO-based clock deskew circuit 302 can modify thephase of output clock signal 304 based on phase information 308.

FIG. 3C illustrates phase curves for an ILO-based clock deskew circuitin accordance with some embodiments described in this disclosure.

The X-axis corresponds to the frequency difference (denoted by “Δω”)between the free-running frequency of the ILO and the frequency of theinjection clock signal, if the injection frequency (which can be thesame as the frequency of the input clock signal) is close to thefree-running frequency. If the injection frequency is much greater orsmaller than the free-running frequency in order to inject theoscillator at a harmonic or sub-harmonic of the ILO, then Δω representsthe difference between the relevant harmonic or sub-harmonic frequencyand the injection frequency. The Y-axis corresponds to the phase (indegrees) of the output clock signal of the ILO. When the injection clocksignal is injected in the in-phase injection point, the ILO operatesalong the top curve (between points “A” and “B”). When the injectionclock signal is injected in the quadrature-phase injection point, theILO operates along the bottom curve (between points “C” and “D”).

The phase of the output clock signal is +90° at point “A,” zero atpoints “B” and “C,” and −90° at point “D.” Frequency difference valueΔωmin corresponds to points “B” and “D,” and frequency difference valueΔωmax corresponds to points “A” and “C.” The ILO-based clock deskewcircuit can switch between in-phase and quadrature-phase injection andfrequency differences Δωmin and Δωmax to switch between operation atpoints “B” and “C” which have the same output clock phase. Note thateach injection point can be viewed as being associated with a phasetuning range. For example, in FIG. 3C, the in-phase injection point maybe associated with a phase tuning range between +90° and 0°, and thequadrature-phase injection point may be associated with a phase tuningrange between 0° and −90°.

The ILO-based clock deskew circuit can vary the phase from +90° to −90°as follows. A phase of +90° can be achieved by operating the ILO atpoint “A,” i.e., by using in-phase injection and a frequency differenceequal to Δωmax. The phase can be decreased from +90° to 0° by moving theoperating point of the ILO from point “A” to point “B” along the topcurve, e.g., by using in-phase injection and decreasing the frequencydifference from Δωmax to Δωmin.

Once point “B” is reached on the top curve, the ILO-based clock deskewcircuit can switch to point “C” in the bottom curve, e.g., by operatingthe ILO in quadrature-phase injection and by changing the frequencydifference to Δωmax. The phase can then be decreased from 0° to −90° bymoving the operating point of the ILO from point “C” to point “D” alongthe bottom curve, e.g., by using quadrature-phase injection anddecreasing the frequency difference from Δωmax to Δωmin.

In some embodiments, the ILO-based clock deskew circuit can adjust thephase over the full 360° range by inverting either the injection clocksignal or the output clock signal of the ILO in addition to performingthe ±90° phase adjustment as explained above.

In some embodiments, for a target phase value, the ILO-based clockdeskew circuit can determine an appropriate injection point and afrequency difference value from the phase curves that will cause thephase of the output clock signal of the ILO to be equal to the targetphase value. Specifically, if frequency difference values Δωmin andΔωmax are determined (e.g., during calibration), the ILO-based clockdeskew circuit can switch between the different injection points at theappropriate frequency difference values. In some embodiments, theILO-based clock deskew circuit can be part of a feedback loop (e.g., aclock and data recovery, or CDR, loop) that adjusts the frequencydifference value in response to a feedback signal that is sensitive tothe output clock phase. In some embodiments, the ILO-based clock deskewcircuit can use linear interpolation, piecewise linear interpolation, orother interpolation methods to determine the frequency difference valueΔω that corresponds to a given phase value.

For example, in some embodiments, the phase of the ILO output signal forinjection at point p can be determined using the following expression:θ=θ_(0,p)+sin⁻¹ (A·Δω/K), where θ is the phase of the ILO output signal,A is an ILO-specific constant, Δω is the difference between thefrequency of the injection clock signal and the free-running frequencyof the ILO, K is the injection strength relative to a nominal ILOsignal, and θ_(0,p) is the nominal phase with Δω=0 for injection atpoint p and injection strength K.

Some embodiments described in this disclosure provide methods andapparatuses for calibrating an ILO-based clock deskew circuit bydetermining frequency difference values (e.g., Δωmin and Δωmax) thatcorrespond to the phase boundaries between adjacent phase tuning rangesassociated with injection points.

FIG. 4A illustrates how an ILO-based clock deskew circuit can becalibrated in accordance with some embodiments described in thisdisclosure.

In some embodiments, demultiplexer 412 can generate an injection signalbased on input clock signal 406, and inject the injection signal intoone of multiple injection points in ILO 410 based on an injection pointselect signal. For example, demultiplexer 412 can inject the injectionsignal into an in-phase or quadrature-phase injection point of ILO 410based on injection point select signal 418. ILO 410 can receivefree-running frequency control signal 416 which can be used to tune thefree-running frequency of ILO 410. Input clock signal 406 can also beprovided as input to ±45° phase shift and delay-matching circuit 420which introduces, into input clock signal 406, a ±45° phase shift and adelay that matches the delay of the active path, e.g., the delay throughdemultiplexer 412 and ILO 410. The outputs of ILO 410 and ±45° phaseshift and delay-matching circuit 420 can be provided as inputs to phasedetector 422. Phase detector 422 can generate phase detector output 424,which can be indicative of the phase difference between the two inputs,namely, the phase difference between the output of ILO 410 and theoutput of ±45° phase shift and delay-matching circuit 420.

Calibration logic 426 can be used to calibrate the ILO-based clockdeskew circuit by determining frequency difference values (e.g., Δωminand Δωmax) that correspond to the phase boundaries associated with theinjection points. In some embodiments, calibration logic 426 can receivephase detector output 424 and generate injection point select signal 418and free-running frequency control signal 416. Calibration logic 426 cansweep the free-running frequency control signal 416 to determine thefree-running frequency signal values that correspond to the switchoverpoint between in-phase and quadrature-phase injection. Specifically, insome embodiments, calibration logic 426 can sweep the free-runningfrequency control signal 416 until the phase of the output of ILO 410 issubstantially equal to the phase of the output of ±45° phase shift anddelay-matching circuit 420. When Δω=0, the phase of the output of ILO410 is equal to +45° for in-phase injection (point “F”) and −45° forquadrature-phase injection (point “G”). The phase of the output of ±45°phase shift and delay-matching circuit 420 is equal to 0° (point “E”),which is −45° with respect to point “F,” and +45° with respect to point“G.” The phase at each of the switchover points “B” and “C” is equal tothe phase at point “E” which corresponds to the phase of the output of±45° phase shift and delay-matching circuit 420. In this manner,calibration logic 426 can determine frequency difference values (e.g.,Δωmin and Δωmax) that correspond to the phase boundaries associated withthe injection points. In some embodiments, calibration logic 426 can bepart of a phase controller, e.g., phase controller 314 shown in FIG. 3A.

FIG. 4B illustrates an embodiment of a ±45° phase shift anddelay-matching circuit in accordance with some embodiments described inthis disclosure.

In some embodiments, ±45° phase shift and delay-matching circuit 420 caninclude ILO 410-R and demultiplexer 412-R that are replicas of ILO 410and demultiplexer 412, respectively. Demultiplexer 412-R can receiveinput clock signal 406 and generate an injection signal that is injectedat both the in-phase and the quadrature-phase injection points of ILO410-R. Specifically, injection point select signal 438 can be providedto demultiplexer 412-R which causes demultiplexer 412-R to inject theinjection clock signal into both the in-phase and the quadrature-phaseinjection points of ILO 410-R. ILO 410-R can be provided a free-runningfrequency control signal 436 so that the free-running frequency of ILO410-R is equal to the frequency of the injection clock signal (which isequal to the frequency of input clock signal 406), Δω=0 for ILO 410-R.Demultiplexer 412-R and ILO 410-R introduce a delay that matches thedelay introduced by demultiplexer 412 and ILO 410 because demultiplexer412-R and ILO 410-R are replicas of demultiplexer 412 and ILO 410,respectively. Under these conditions (i.e., when the signal is injectedsimultaneously at in-phase and quadrature-phase injection points, Δω=0,and delays of ILOs 410-R and 412-R match delays of ILOs 410 and 412,respectively), ILO 410-R produces an output signal whose phasecorresponds to point “E” in FIG. 3C. The output of ILO 410-R can now beused as a reference for calibrating the phase boundaries of ILO 410.

FIG. 4C presents a flowchart that illustrates a process for calibratingan ILO-based clock deskew circuit in accordance with some embodimentsdescribed in this disclosure.

The process can begin by a calibration system (e.g., calibration logic426) receiving phase detector output (operation 452). The phase detectoroutput (e.g., phase detector output 424) can indicate a phase differencebetween the output of a first ILO (e.g., ILO 410) and the output of asecond ILO (e.g., ILO 410-R). The calibration system can provide afree-running frequency control value to one or both of the ILOs.Specifically, in some embodiments, the calibration system can select oneof the ILOs to be an active ILO, and the other to be a reference ILO.Next, the calibration system can select an injection point (e.g.,injection point “I” or “Q”) for calibration. The calibration system canthen set the free-running frequency of one of the ILOs (e.g., thereference ILO) to be equal to the frequency of the input clock signal,and sweep the free-running frequency of the other ILO (e.g., the activeILO). For a given free-running frequency control value, the calibrationsystem can determine whether the difference between the phases of thetwo ILOs is substantially equal to a pre-determined value (operation458). For example, in embodiments that use a zero-phase detector, thepre-determined value can be zero, whereas in embodiments that use anXOR-based phase detector, the pre-determined value can be +90° or −90°.In some embodiments, the calibration system can determine that thedifference between the phases of the two ILOs is substantially equal tothe pre-determined value when the calibration system detects a signchange in the phase detector output as the free-running frequency of theactive ILO is swept. If the difference between the two phases is notsubstantially equal to the pre-determined value, the system can adjustthe free-running frequency control value (operation 456). On the otherhand, if the difference between the phases is substantially equal to thepre-determined value, the calibration system can store the free-runningfrequency control value and associate the stored free-running frequencycontrol value with a phase boundary (operation 454).

FIG. 5A illustrates an ILO-based clock deskew circuit in accordance withsome embodiments described in this disclosure.

ILO-based clock deskew circuit 502 can include phase controller 514,demultiplexers 512-1 and 512-2, ILOs 510-1 and 510-2, and multiplexer520. Input clock signal 506 can be provided as input to demultiplexers512-1 and 512-2. Demultiplexers 512-1 and 512-2 can receive injectionpoint select signals 518-1 and 518-2, respectively. Demultiplexers 512-1and 512-2 can inject an injection clock signal into ILOs 510-1 and510-2, respectively, based on the injection point select signalsreceived by the demultiplexers. Demultiplexer 512-1 and 512-2 can alsoadjust the amplitude of the injection clock signal (shown in FIG. 5A asgain “K”).

ILOs 510-1 and 510-2 can receive free-running frequency control signals516-1 and 516-2, respectively. The outputs of ILOs 510-1 and 510-2 canbe provided as inputs to multiplexer 520. Based on ILO output selectsignal 522, multiplexer 520 can select the output of ILO 510-1 or theoutput of ILO 510-2 as output clock signal 504. Phase controller 514 canreceive phase information 508. Phase controller 514 can generate, basedon phase information 508, injection point select signals 518-1 and518-2, free-running frequency control signals 516-1 and 516-2, and ILOoutput select signal 522.

FIG. 5B presents a flowchart that illustrates a process for modifyingthe phase of a clock signal using an ILO-based clock deskew circuit,e.g., ILO-based clock deskew circuit 502, in accordance with someembodiments described in this disclosure.

In some embodiments, an ILO-based clock deskew circuit can receive phaseinformation (operation 552). The phase information can indicate a targetphase setting for the output clock signal of the ILO. Next, theILO-based clock deskew circuit can select an ILO based on the phaseinformation, and determine an injection point and a free-runningfrequency value based on the phase information (operation 554).

The ILO-based clock deskew circuit can then inject the injection clocksignal at the determined injection point in the selected ILO, tune thefree-running frequency of the selected ILO to the determinedfree-running frequency value, and output the output signal of theselected ILO (operation 556).

Specifically, in some embodiments, phase controller 514 can select anILO by selecting the ILO's output signal using ILO output select signal522, and generate injection point select signals 518-1 and 518-2 andfree-running frequency control signals 516-1 and 516-2 based on phaseinformation 508. Phase controller 514 can use injection point selectsignals 518-1 and 518-2 to inject the injection clock signal at aparticular injection point in ILOs 510-1 and 510-2, respectively. Phasecontroller 514 can use free-running frequency control signals 516-1 and516-2 to tune the free-running frequencies of ILOs 510-1 and 510-2,respectively.

In some embodiments, an ILO-based clock deskew circuit can use one ofthe ILOs for in-phase injection and the other for quadrature-phaseinjection. For example, suppose ILO-based clock deskew circuit 502 usesILO 510-1 for in-phase injection and ILO 510-2 for quadrature-phaseinjection. Now, given a phase value, phase controller 514 can determinewhether generating the phase requires in-phase injection orquadrature-phase injection. If the phase is to be generated usingin-phase injection, phase controller 514 can use injection point selectsignal 518-1 to select in-phase injection for ILO 510-1, provide anappropriate free-running frequency control signal 516-1 to ILO 510-1,and use ILO output select signal 522 to select the output of ILO 510-1.On the other hand, if the phase is to be generated usingquadrature-phase injection, phase controller 514 can use injection pointselect signal 518-2 to select quadrature-phase injection for ILO 510-2,provide an appropriate free-running frequency control signal 516-2 toILO 510-2, and use ILO output select signal 522 to select the output ofILO 510-2.

FIG. 6A illustrates how an ILO-based clock deskew circuit can becalibrated in accordance with some embodiments described in thisdisclosure.

In some embodiments, input clock signal 606 can be provided as input todemultiplexers 612-1 and 612-2. Demultiplexers 612-1 and 612-2 canreceive injection point select signals 618-1 and 618-2, respectively.Demultiplexers 612-1 and 612-2 can inject an injection clock signal intoILOs 610-1 and 610-2, respectively, based on the injection point selectsignals received by the demultiplexers. ILOs 610-1 and 610-2 can receivefree-running frequency control signals 616-1 and 616-2, respectively.The outputs of ILOs 610-1 and 610-2 can be provided as inputs to phasedetector 622. Phase detector 622 can generate phase detector output 624,which can be indicative of the phase difference between the two inputs,namely, the phase difference between the outputs of ILOs 610-1 and610-2.

Calibration logic 626 can be used to calibrate the ILO-based clockdeskew circuit by determining frequency difference values (e.g., Δωminand Δωmax) that correspond to the phase boundaries associated with theinjection points. In some embodiments, calibration logic 626 can receivephase detector output 624 and generate injection point select signals618-1 and 618-2, and free-running frequency control signals 616-1 and616-2. Calibration logic 626 can set the injection point select signals618-1 and 618-2 to select two adjacent phase ranges for the two ILOs,such as in-phase and quadrature phase, respectively. Calibration logic626 can then sweep the free-running frequency control signals 616-1 and616-2 in opposite directions starting from the input clock frequency(that is, from Δω=0 for both ILOs) to determine the free-runningfrequency signal values that correspond to the switchover point betweenthe two phase ranges. Specifically, in some embodiments, calibrationlogic 626 can sweep the free-running frequency control signals 616-1 and616-2 until the phase of the output of ILO 610-1 is substantially equalto the phase of the output of ILO 610-2. For example, if ILO 610-1 hasthe injection point selected as “I” and ILO 610-2 has the injectionpoint selected as “Q”, and free-running frequency control signal 616-1is swept in the negative direction (e.g., from point “F” to point “B” inFIG. 3C) while free-running frequency control signal 616-2 is swept inthe positive direction (e.g., from point “G” to point “C” in FIG. 3C),then the two ILO output phases may be equal when ILOs 610-1 and 610-2are operating at switchover points “B” and “C” in FIG. 3C, respectively.In this manner, calibration logic 626 can determine frequency differencevalues (e.g., Δωmin and Δωmax) that correspond to the phase boundariesassociated with the injection points. In some embodiments, calibrationlogic 626 can be part of a phase controller, e.g., phase controller 514shown in FIG. 5A.

The phase tuning curves in FIG. 3C are shown as being symmetric withrespect to positive and negative adjustment of the free-runningfrequency control offset Δω. However, in some embodiments the curves maynot be symmetric. In such embodiments, when the free-running frequenciesof the two ILOs are swept in opposite directions, the phases of the twoILOs may be equal at a non-zero phase value, i.e., at a phase that isearlier or later than 0°. However, even in such embodiments, calibrationlogic 626 can successfully determine free-running frequency controlvalues Δωmin and Δωmax that correspond to the switchover points.

FIG. 6B presents a flowchart that illustrates a process for calibratingan ILO-based clock deskew circuit in accordance with some embodimentsdescribed in this disclosure.

The process can begin with a calibration system (e.g., calibration logic626) setting two ILOs to adjacent phase tuning ranges and setting thefree-running frequencies of the two ILOs to match the input clockfrequency or a harmonic or sub-harmonic of the input clock frequency(operation 660). Next, the calibration system can receive phase detectoroutput (operation 652). The phase detector output (e.g., phase detectoroutput 624) can indicate a phase difference between the outputs of thetwo ILOs (e.g., ILOs 610-1 and 610-2).

The calibration system can then sweep the free-running frequencies ofthe two ILOs in opposite directions until the phases of the outputs ofthe two ILOs are substantially equal. In some embodiments, thecalibration system can iteratively adjust the free-running frequenciesof the two ILOs, and check the phase detector output 624 to determinewhether the difference between the two phases is substantially equal toa pre-determined value (operation 658). For example, in embodiments thatuse a zero-phase detector, the pre-determined value can be zero, whereasin embodiments that use an XOR-based phase detector, the pre-determinedvalue can be +90° or −90°. In some embodiments, the calibration systemcan determine that the phases of the two ILOs are substantially equalwhen the calibration system detects a sign change in the phase detectoroutput.

If the difference between the two phases is not substantially equal tothe pre-determined value, the system can adjust the free-runningfrequency control values in opposite directions (operation 654). On theother hand, if the difference between the two phases is substantiallyequal to the pre-determined value, the calibration system can store thefree-running frequency control values (for example, in registercircuits) and associate the stored free-running frequency control valueswith a phase boundary between the adjacent phase tuning ranges(operation 656). In some embodiments, the system can determine afree-running frequency control value that corresponds to a given phaseof the output clock signal by interpolating between the storedfree-running frequency control values.

For example, in FIG. 3C, the calibration system can move the operatingpoint of ILO 610-1 along the top curve from the midpoint (i.e., theoperating point that corresponds to Δω=0) to point “B,” and move theoperating point of ILO 610-2 along the bottom curve from the midpoint topoint “C.” Note that the output phases of ILOs 610-1 and 610-2 will besubstantially equal when ILOs 610-1 and 610-2 simultaneously reachoperating points “B” and “C,” respectively. When this happens, thecalibration system can store the free-running frequency control valuescorresponding to points “B” and “C,” and use these free-runningfrequency control values for switching between in-phase injection andquadrature-phase injection. In an embodiment, a register circuit is usedto store the free-running frequency control values corresponding topoints “B” and “C.”

In some embodiments, the ILO-based clock deskew circuit can include morethan two phase tuning ranges. For example, each ILO in an ILO-basedclock deskew circuit can have n injection points denoted by p₀, p₁, . .. p_(n-1) that correspond to n phase tuning ranges R₀, R₁, . . .R_(n-1), that are centered at phases θ₀, θ₁, . . . θ_(n-1). Some of then injection points may correspond to the same injection node in the ILOcircuit, but with opposite phase. For example, injection at an in-phaseoscillator node with either positive or negative injection amplitude maybe generally be considered as two different injection points, becausethey correspond to two distinct injection selections with distinct phasetuning ranges and center phases.

In embodiments that are similar to the embodiments illustrated in FIGS.3A-3C and FIGS. 4A-4C, the ILO-based clock deskew circuit can determinean injection point from the n injection points and a free-runningfrequency value based on the target phase value. Next, the ILO-basedclock deskew circuit can inject the injection signal at the determinedinjection point and tune the ILO to the determined free-runningfrequency value.

To calibrate the boundary between the adjacent phase tuning ranges R_(k)and R_(k+1,) the calibration logic can simultaneously inject theinjection signal into injection points p_(k) and p_(k+1) of the replicaILO, and sweep the free-running frequency of the active ILO until thephase difference between phases of the replica ILO and the active ILO issubstantially equal to a pre-determined value. For example, thecalibration logic can simultaneously inject the injection signal intoinjection points p_(k) and p_(k+1) of the replica ILO, and sweep thefree-running frequency of the active ILO until the phases of the replicaILO and the active ILO are substantially equal (i.e., the phasedifference between the replica ILO and the active ILO is nominallyzero). Once the free-running frequency control signal values for thephase boundaries have been determined, the ILO-based clock deskewcircuit can generate an output clock signal with a given target phase bydetermining an injection point and a free-running frequency controlsignal value.

In embodiments that are similar to the embodiments illustrated in FIGS.5A-5B and FIGS. 6A-6B, the ILO-based clock deskew circuit can use thetwo ILOs in an alternating fashion. For example, the ILO-based clockdeskew circuit can use one of the ILOs for odd numbered phase tuningranges (e.g., phase tuning ranges R₁, R₃, R₅, etc.) and the other foreven numbered phase tuning ranges (e.g., phase tuning ranges R₀, R₂, R₄,etc.). Given a target phase value, the ILO-based clock deskew circuitcan select an ILO and determine an injection point from the n injectionpoints and a free-running frequency value. Next, the ILO-based clockdeskew circuit can inject the injection signal at the determinedinjection point of the selected ILO and tune the selected ILO to thedetermined free-running frequency value.

Some embodiments may use calibration logic to calibrate the phaseboundaries, and use the calibrated phase boundaries to switch betweenthe two ILOs. Specifically, to calibrate the boundary between theadjacent phase tuning ranges R_(k) and R_(k+1), the calibration logiccan inject an injection signal at injection point p_(k) in one of theILOs and inject the injection signal at injection point p_(k+1) in theother ILO. The calibration logic can then concurrently sweep thefree-running frequencies of the two ILOs in opposite directions untilthe phases of their output signals are substantially equal to eachother. Once the free-running frequency control signal values for thephase boundaries have been determined, the ILO-based clock deskewcircuit can generate an output clock signal with a given target phase byselecting an ILO and by determining an injection point and afree-running frequency control signal value. Some embodiments may notneed to calibrate the phase boundaries beforehand. Specifically, theseembodiments may switch between the two ILOs when the phases of the twoILOs match.

FIG. 7A illustrates an ILO-based clock deskew circuit in accordance withsome embodiments described in this disclosure.

ILO-based clock deskew circuit 702 can include phase controller 714,demultiplexers 712-1 and 712-2, ILOs 710-1 and 710-2, and multiplexer720. ILOs 710-2 and 710-2 can have two or more injection points. Inputclock signal 706 can be provided as input to demultiplexers 712-1 and712-2. Demultiplexers 712-1 and 712-2 can receive injection point selectsignals 718-1 and 718-2, respectively, to select an injection point fromthe two or more injection points. Demultiplexers 712-1 and 712-2 caninject an injection clock signal into ILOs 710-1 and 710-2,respectively, based on the injection point select signals received bythe demultiplexers. Demultiplexer 712-1 and 712-2 can also adjust theamplitude of the injection clock signal (shown in FIG. 7A as gain “K”).

ILOs 710-1 and 710-2 can receive free-running frequency control signals716-1 and 716-2, respectively. The outputs of ILOs 710-1 and 710-2 canbe provided as inputs to multiplexer 720. Based on ILO output selectsignal 722, multiplexer 720 can select the output of ILO 710-1 or theoutput of ILO 710-2 as output clock signal 704. Phase controller 714 canreceive phase information 708. Phase controller 714 can generate, basedon phase information 708, injection point select signals 718-1 and718-2, free-running frequency control signals 716-1 and 716-2, and ILOoutput select signal 722.

The outputs of ILOs 710-1 and 710-2 can be provided as inputs to phasedetector 724. Phase detector 724 can generate phase detector output 726,which can be indicative of the phase difference between the two inputs,namely, the phase difference between the outputs of ILOs 710-1 and710-2. Phase detector output 726 can then be provided as an input tophase controller 714, which can use phase detector output 726 todetermine when to switch between injection points.

In some embodiments, ILO-based clock deskew circuit 702 can use ILOs710-1 and 710-2 in an alternating fashion while calibrating or detectingthe phase boundaries between adjacent phase tuning ranges as the targetphase is adjusted.

FIG. 7B illustrates phase tuning curves for three successive injectionpoints p_(k), p_(k+1), and p_(k+2) in accordance with some embodimentsdescribed in this disclosure. For example, with ILOs capable ofreceiving injection signals at in-phase and quadrature-phase injectionpoints with positive or negative amplitude, these three curves mightcorrespond to injection points “+Q” (quadrature-phase injection), “+1”(in-phase injection), and “−Q” (quadrature-phase injection withinversion), respectively.

Consider the case where the active ILO (e.g., ILO 710-1), whose outputis selected by multiplexer 720 as the output clock signal, is configuredto operate with injection at injection point p_(k) and with positivefree-running frequency offset Δω. In this case, the phase controller 714may configure the reference ILO (e.g., ILO 710-2), whose output is notselected by multiplexer 720, with injection at injection point p_(k+1)and negative free-running frequency offset −Δω. As phase controller 714increases the output phase by increasing Δω on the active ILO, itsimultaneously decreases −Δω on the reference ILO, thereby moving thephase of active ILO from point “E” towards point “A” and moving thephase of reference ILO from point “F” towards point “B.”

When the ILOs reach points “A” and “B,” they have the same phase. Whenthis condition is detected by phase detector 724, phase controller 714(which receives phase detector output 726) switches the output selectionmultiplexer 720 so that the reference ILO injecting at injection pointp_(k+1) is now the active ILO, and the active ILO injecting at injectionpoint p_(k+1) is now the reference ILO. The phase controller cancontinue to increase the output clock phase by increasing Δω on the nowactive ILO injecting at injection point p_(k+1). In some embodiments, aslong as the active free-running frequency offset Δω is negative, thereference ILO continues to inject at injection point p_(k). In theseembodiments, as the negative Δω moves closer to zero, the phase of theactive ILO may move from point “B” to point “F,” and the phase of thereference ILO may move from point “A” to point “E.”

In some embodiments, if phase controller 714 increases the active ILOfree-running frequency offset Δω to be positive, it then switches thereference ILO to stop injecting at injection point p_(k) and startinjecting at injection point p_(k+2). As phase controller 714 continuesto increase the output clock phase by increasing the now positive Δωvalue on the active ILO (which is injecting at injection point p_(k+1)),it simultaneously decreases the negative Δω value on the reference ILO(which is injecting at injection point p_(k+2)), thereby moving thephase of active ILO from point “F” towards point “C” and moving thephase of reference ILO from point “G” towards point “D.” As the two ILOphases reach points “C” and “D,” the active and reference ILOs againswitch responsibility.

A similar process can occur when phase controller 714 decreases theoutput clock phase, with the steps outlined above occurring in reversedirection and order. Note that whenever the active ILO free-runningfrequency offset is positive, the reference ILO can be operated withnegative free-running frequency offset at the succeeding injection pointcorresponding to an adjacent advanced phase range, which is the phaserange that will be needed when Δω increases past the upper controlboundary (e.g., Δωmax). Similarly, whenever the active ILO free-runningfrequency offset is negative, the reference ILO can be operated withpositive free-running frequency offset at the preceding injection pointcorresponding to an adjacent retarded phase range, which is the phaserange that will be needed when Δω decreases below the lower controlboundary (e.g., Δωmin).

FIG. 8 illustrates a memory controller that includes an ILO-based clockdeskew circuit in accordance with some embodiments described in thisdisclosure.

Memory controller 800 may be coupled with memory module 804 via one ormore signal lines, which may carry control signals, clock signals,and/or data signals. In an embodiment, memory module 804 includes one ormore memory devices having arrays of memory cells. Examples of memorydevices include dynamic random access memory (DRAM) devices such assynchronous double data rate (DDR) DRAM or non volatile memory such asFlash memory. In some embodiments, memory controller 800 is anintegrated circuit device having an interface that orchestrates dataflow to and from a memory device. In various embodiments, memorycontroller 800 is disposed, along with one or more memory devices, on acircuit board, or may reside with the memory device in a commonencapsulated package, or included in a stack configuration with thememory device (for example, in a package on package (PoP) configurationor using through silicon via (TSV) technology).

Memory controller 800 may include one or more ILO-based clock deskewcircuits, such as ILO-based clock deskew circuit 802. In someembodiments, memory controller 800 may use ILO-based clock deskewcircuit 802 to adjust the phase of a clock signal. For example, memorycontroller 800 may use ILO-based clock deskew circuit 802 to adjust thephase of a clock signal that is used for communicating between memorycontroller 800 and a memory device disposed on memory module 804.

Any data structures and/or code described in this disclosure can bestored on a computer-readable storage medium, which may be any device ormedium that can store code and/or data for use by a computer system. Thecomputer-readable storage medium includes, but is not limited to,volatile memory, non-volatile memory, magnetic and optical storagedevices such as disk drives, magnetic tape, CDs (compact discs), DVDs(digital versatile discs or digital video discs), or other media capableof storing computer-readable media now known or later developed.

The methods and/or processes described in this disclosure can beembodied as code and/or data, which can be stored in a computer-readablestorage medium as described above. When a computer system reads andexecutes the code and/or data stored on the computer-readable storagemedium, the computer system performs the methods and/or processes.

The methods and/or processes described in this disclosure can also beembodied in hardware. Hardware embodiments include, but are not limitedto, application-specific integrated circuit (ASIC) chips,field-programmable gate arrays (FPGAs), and other programmable-logicdevices now known or later developed. For example, the memory controller800 shown in FIG. 8 may be a processor (e.g., with multiple processorcores), a system-on-chip (SoC), an ASIC, a graphics processing unit(GPU), a mobile applications processors, an FPGA, etc. It should also benoted that the use of the ILO based methods and apparatuses describedherein are not limited to the functionality of the signaling interfaceof a memory controller. Specifically, the ILO based methods andapparatuses described herein may be used in the above mentioned chipsfor other applications or purposes, such as other types of signalinginterfaces or clocking where deskewing or generation of a clock signalmay be desired.

Various modifications to the disclosed embodiments will be readilyapparent to those skilled in the art, and the general principles definedherein may be applied to other embodiments and applications withoutdeparting from the spirit and scope of the present disclosure. Thus, thescope of the present disclosure is not limited to the embodiments shown,but is to be accorded the widest scope consistent with the principlesand features disclosed herein.

What is claimed is:
 1. A circuit, comprising: an injection-locked oscillator (ILO) having a free-running frequency that is controlled by at least a control value; and circuitry to determine at least a first control value that corresponds to a phase boundary between two adjacent phase tuning ranges of the ILO.
 2. The circuit of claim 1, further comprising circuitry to store the first control value.
 3. The circuit of claim 2, further comprising circuitry to determine a second control value that corresponds to a phase difference with respect to a reference phase, wherein the second control value is determined based on the stored first control value.
 4. The circuit of claim 3, further comprising circuitry to provide the second control value to the ILO.
 5. The circuit of claim 1, wherein the circuitry to determine at least the first control value comprises circuitry to select an injection point of the ILO, wherein the injection point corresponds to one of the two adjacent phase tuning ranges of the ILO.
 6. The circuit of claim 5, wherein the circuitry to determine at least the first control value comprises circuitry to sweep the free-running frequency of the ILO until the phase boundary between the two adjacent phase tuning ranges of the ILO is detected.
 7. The circuit of claim 1, wherein the ILO is based on a ring oscillator.
 8. The circuit of claim 1, wherein the ILO is based on a tank circuit.
 9. A controller device that controls the operation of a memory device, the controller device comprising: an injection-locked oscillator (ILO) having a free-running frequency that is controlled by at least a control value; and circuitry to determine at least a first control value that corresponds to a phase boundary between two adjacent phase tuning ranges of the ILO.
 10. The controller device of claim 9, further comprising circuitry to store the first control value.
 11. The controller device of claim 10, further comprising circuitry to determine a second control value that corresponds to a phase difference with respect to a reference phase, wherein the second control value is determined based on the stored first control value.
 12. The controller device of claim 11, further comprising circuitry to provide the second control value to the ILO.
 13. The controller device of claim 9, wherein the circuitry to determine at least the first control value comprises circuitry to select an injection point of the ILO, wherein the injection point corresponds to one of the two adjacent phase tuning ranges of the ILO.
 14. The controller device of claim 13, wherein the circuitry to determine at least the first control value comprises circuitry to sweep the free-running frequency of the ILO until the phase boundary between the two adjacent phase tuning ranges of the ILO is detected.
 15. The controller device of claim 9, wherein the ILO is based on a ring oscillator.
 16. The controller device of claim 9, wherein the ILO is based on a tank circuit.
 17. A method, comprising: in a circuit comprising an injection-locked oscillator (ILO) having a free-running frequency that is controlled by at least a control value, determining at least a first control value that corresponds to a phase boundary between two adjacent phase tuning ranges of the ILO.
 18. The method of claim 17, further comprising storing the first control value.
 19. The method of claim 18, further comprising determining a second control value that corresponds to a phase difference with respect to a reference phase, wherein the second control value is determined based on the stored first control value.
 20. The method of claim 17, wherein said determining at least the first control value comprises: injecting an injection signal into an injection point of the ILO that corresponds to one of the two adjacent phase tuning ranges of the ILO; and modifying the free-running frequency of the ILO until the phase boundary between the two adjacent phase tuning ranges of the ILO is detected. 